About Spring Contact Probes:
Spring probes are used for contacting and testing of electronic components and assemblies and usually consist of a plunger, a spring, and a barrel.
All spring probes have a similar functional principle with a spring-loaded plunger and recommended working stroke.
Depending on the electronic assembly and the test points to be contacted, different plunger tip styles are available.
By combining the optimally selected version and spring force, precise, safe and replicable contacting can be achieved. Tip styles for pads, VIAs, pins, posts and connectors are available.
We offer an unsurpassed variety of spring-loaded test probes.
Our test probes fulfil RoHS regulations.
2022 年 3 月 29 日
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